Detection of finger interruptions in silicon solar cells using photoluminescence imaging
Lei Zhang1,2, Peng Liang1,2, Hui-Shi Zhu1,2, Pei-De Han, 1,2,‡
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 101407, China
† Corresponding author. E-mail: zhanglei615@semi.ac.cn, pdhan@red.semi.ac.cn

© 2018 Chinese Physical Society and IOP Publishing Ltd.

 

Abstract

Since publication, it has been brought to the attention of the Editorial Office of Chinese Physics B that parts of this paper showed strong similarities to the following article (including one equation, some analyses, the motivation and the conclusion) without citation: “Detection of Finger Interruptions in Silicon Solar Cells Using Line Scan Photoluminescence Imaging,” IEEE Journal of Photovoltaics, 2017, vol. 7, No. 6, pp. 1496–1502.

Following our investigation, this article has been retracted by the Editorial Office of Chinese Physics B.